X56 DXD+ X-ray System Detects Low-Density Contaminants

Mettler Toledo's X56 DXD+ dual energy photon-counting x-ray system uses AI to cut false rejects in packaged food inspection.

Low-density contaminants like rubber and plastic are difficult for conventional single-energy X-ray systems to catch, especially in complex packaged formats such as pet food, potato chips, or multipacks, where thickness, density, and overlapping textures vary widely. X56 DXD+ is a dual-energy photon-counting x-ray inspection system with AI capabilities, built to detect these contaminants reliably and help manufacturers meet regulatory and retailer requirements.

The system is powered by DXD+ detector technology and Advanced Material Discrimination Pro (AMD Pro) software, giving it detection sensitivity for noisy or high-contrast products where single-energy systems can fall short. AI integration helps improve inspection accuracy in complex scenarios like overlapping or mixed products, reducing unnecessary rejections. The system is built in a 19.7 in (500 mm) width and handles medium to large-sized products on single lanes or smaller packages across multiple lanes, with throughput up to 500 products per minute. It includes toolless belt removal for cleaning and a hygienic design for high-speed, high-volume environments. Built-in quality tools cover completeness checks, clip detection, and product-trapped-in-seal inspection. The system is compatible with a range of conveyor heights and reject options in single or multi-lane configurations, and records a full image database that can integrate with Mettler Toledo's ProdX data management software for centralized monitoring, real-time reporting, and audit readiness.

Applications

  • Contamination detection in packaged products
  • Completeness and clip detection checks
  • Product-trapped-in-seal inspection

Industries

  • Food Manufacturing
  • Pet Food Production
  • Packaged Goods

Who It's For

  • Detecting low-density contaminants in complex packaging
  • Reducing false rejects on high-speed lines
  • Centralized, traceable compliance data across facilities

Features:

  • Dual energy photon-counting x-ray technology
  • DXD+ detector technology with AMD Pro software
  • AI-assisted detection for overlapping/mixed products
  • 19.7 in (500 mm) system width
  • Throughput up to 500 products/min
  • Single or multi-lane configurations
  • Toolless belt removal for cleaning
  • Completeness, clip detection, and seal inspection checks
  • Compatible with multiple conveyor heights and reject options
  • Recorded image database, integrable with ProdX data management software

METTLER TOLEDO Product Inspection Group

Contributors:
This piece was created with the help of generative AI tools and edited by our content team for clarity and accuracy.