250 GHz Broadband Probe Solution Enables Sub-THz Wafer Testing
The 250 GHz Broadband Probe Solution from MPI Corp. combines high-frequency TITAN RF Probes with wafer-level probe station platforms to support precision semiconductor testing up to 250 GHz. The system is designed for use with the Keysight NA5305A/7A PNA-X Frequency Extender, along with broadband S-parameter characterization, modulated wideband, and nonlinear measurements without complex setup requirements.
The solution includes the single-ended TITAN T250MAK and differential TITAN T250MSK probes, which use a 0.5 mm broadband coaxial interface. The probes are available in single-ended (GSG) and dual (GSGSG) configurations to accommodate different device types. They provide ultra-low insertion loss and excellent return loss across the frequency range, along with clear tip visibility, retractable tip protection, and mechanical stability for consistent alignment and safe handling.
Integration with probe station platforms enables temperature-controlled, wafer-level measurements with minimal user intervention and repeatable results. By supporting calibrated, single-sweep broadband measurements up to 250 GHz, the solution addresses the needs of semiconductor developers working on AI, 5G/6G, and high-speed optical communication technologies.
Features:
- Compatible with Keysight NA5305A/7A PNA-X Frequency Extender
- Broadband S-parameter measurements up to 250 GHz
- TITAN T250MAK (single-ended) and T250MSK (differential) probe options
- 0.5 mm broadband coaxial interface
- Ultra-low insertion loss and excellent return loss
- Clear tip visibility and stable alignment
- Retractable tip protector for safe handling
- Single-ended (GSG) and dual (GSGSG) configurations
- Temperature-controlled wafer-level testing
- Support for modulated wideband and nonlinear measurements
MPI Corporation
San Jose, CA
(408) 770-3650
[email protected]
mpi-corporation.com