Roughness and Contour Measuring Devices

June 20, 2018
Jenoptik's metrology devices offer an axis travel speed that is six times faster than previous models.

The latest generation of Waveline W800 roughness and contour measuring devices, designed to meet a variety of customer requirements for flexible, precise, and fast measurement, includes four different configurations. A 120-mm traverse unit and 500 mm vertical measuring column are included on the basic configurations.


An axis travel speed more than six times faster than previous models and an improvement in the ambient noise of approximately 30% demonstrate the significant performance improvement in comparison to the existing models.


The W800 model series offers a probing system for every application so the instrument is well suited to many different measuring tasks in the measuring room, manual or semi-automated measuring processes. An additional benefit is the ease with which the probing systems can be swapped via a new magnetic quick-change adapter. This provides a very high degree of flexibility to daily routine measurements. Measuring station configurations are modular and can easily be expanded at a later stage or integrated into existing measuring systems.