MarSurf XR 1 Surface Measuring System

Aug. 2, 2012
Mahr's surface measurement system provides an affordable entry into the world of modern, PC-based measurement and evaluation systems.

The MarSurf XR 1 combines the skidded and skidless drive units of Mahr's portable M-Series instruments, with its MarWin evaluation software. The XR 1 provides an affordable entry into the world of modern, PC-based measurement and evaluation systems, including compliance with all International standards, diverse evaluation methods, extensive documentation, large storage capacity, data export and import, as well as networking and other benefits.


The XR 1 comes standard with a basic version of MarWin surface evaluation software which includes Measuring Station View; automatic user login; R, Rk, P, W, Motif, and D-profile and parameters; Export ASCII; Profile Assistant for USB; and Measuring Assistant Level 1 for simple setup of measurement conditions. With the RD 18 skidded probe on the XR 1, cut-off lengths between .003 in. (0.08 mm) and 0.1 in. (2.5 mm) can be selected by the user or automatically determined based on the actual surface profile being measured.


The ergonomically designed drive unit can take measurements in any position, and the prismatic-shaped bottom can even act as a Vee block for positioning small parts. Threaded sockets in the undercarriage allow the attachment of accessories, and rechargeable batteries provide capacity for approximately 1,000 measurements before recharging.


Benefits of the MarSurf SD 26 Skidless drive unit on the XR 1 include a proprietary motorized probe height adjustment feature that quickly and automatically zeros the probe in seconds and can cut measurement time in half and a magnetic, breakaway probe mounting system which protects sensitive probes from accidental damage and facilitates fast probe changes.

  • Over 80 surface parameters for R-, P- and W-profiles as per current standard ISO/JIS or MOTIF (ISO12085)
  • Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required
  • Comprehensive measuring records
  • Quick&Easy measuring programs can be created quickly using teach-in methods
  • Automatic function for choosing cutoff and traversing length
  • Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
  • Adjustable maintenance and calibration intervals
  • Multiple measuring station configurations are available for custom applications
  • Range of options provides system flexibility
  • Various user levels protect the device against misuse and prevent unauthorized people from using it
  • Different drive units or devices can be connected simultaneously to MarSurf XR 1
 Measuring Principle Stylus method Probe BFW skidless with MarSurf SD 26 drive unit
 and/or PHT skidded with MarSurf RD 18 drive unit Measuring Range +/- 250 µm applies to BFW system
 350 µm applies to PHT probe system Filter (ISO/JIS) filter (ISO 16610-21)
 robust Gaussian filter a per ISO 16610-31 Traversing Lengths GD 26/SD 26: Automatic: 0.02, 0.07, 0.2, 0.7, and 2 in.
 (0.56, 1.75, 5.6, 17.5, and 56 mm) 
 RD 18: Automatic: 0.07, 0.2, and 0.7 in.
 (1.75, 5.6, and 17.5 mm) Number of Sampling Length  1 to 50 (default: 5) Stylus 2 µm Measuring Force 0.75 mN