ZEISS Research Microscopy Solutions

arivis Pro version 4.2 from ZEISS gives researchers better flexibility to tailor microscopy image analysis to their needs with AI-powered segmentation tools, 3D analysis capabilities...

ZEISS' latest confocal imager now offers Multiplex Mode to provide more options to fit more imaging speeds and resolution.

The Xradia 610 & 620 Versa X-ray microscopes excel through faster non-destructive imaging of intact samples without sacrificing resolution and contrast over the full ...

ZEISS' modulated software operates all devices with the same interface.

Zeiss Microscopy's tomography system performs non-destructive failure analysis to identify internal defects without cutting your sample or workpiece.

All models from ZEISS feature high-speed USB 3.0 connections.

ZEISS presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications.