Olympus America, Inc.

Overcoming the Challenges of Metallographic Examination Using a Digital Microscope

Dec. 22, 2021
The DSX1000 digital microscope has been designed to solve assorted challenges to improve overall inspection processes and to increase throughput.

Improve Your Process for Higher Throughput

Inspecting metal structures using a conventional optical microscope can be challenging:

  • The microscope is complicated, and it takes a lot of time and effort to get a good image
  • The image quality changes depending on who’s using the microscope
  • Under low magnification, it’s hard to see a metal structure’s grain boundaries
  • The metal samples need to be polished and made flat to be observed, and this takes skill and experience
  • The microscope can’t focus on the entire polished surface at once, making it time-consuming to create an image with a wide field of view
  • If the sample’s surface is uneven, it’s difficult to determine the exact features
  • It’s impossible to measure surface roughness to analyze the surface’s condition
  • It’s difficult to manually collect and analyze individual measurement results

If you’ve experienced any of these challenges, you know how frustrating it can be.

We designed the DSX1000 digital microscope to solve these challenges so that you can improve your overall inspection process and increase your throughput.

Click the download button below to keep reading to learn how the DSX1000 digital microscope overcomes each of the challenges described above.

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